| Mfg Part Number: 1N5597 | NSN : 5961-00-011-9482 | NIIN : 000119482 |
| CAGE Code : 07688 | Manufacturer: Joint Electron Device Engineering | Item Name : Semiconductor Devic |
| FSC : 5961 Semiconductor Devices and Associated Hardware |
Thank you for choosing NSN Catalogue for all your operational needs. You have reached our NSN RFQ Page which features our in-demand NSN 5961-00-011-9482 part 1N5597 with Semiconductor Devic manufactured by MFG Joint Electron Device Engineering. Some of these items include part number 1N5597, and various others, all of which have been subjected to a number of quality assurance measures, tests, verifications, and assessments. At NSN Catalogue, we make it our priority to only source from top global manufacturers that we trust, assuaging the worry of receiving quality items from us.
The NSN 5961-00-011-9482 products 1N5597 that we feature by MFG Joint Electron Device Engineering are paired alongside CAGE Code 07688. NSN Catalogue utilizes CAGE Codes, allowing our customers to narrow down our vast listings by using our optimized search engine and filters. If you are familiar with the CAGE Codes associated with the particular NSN parts and components you wish to purchase, we invite you to use them. If you have more information regarding the NSN items you wish to purchase, please provide such details in the provided RFQ form below. When you fill out a form, in return, you will be provided a competitive quote for your comparisons in just 15 minutes or less.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-00-011-9482 Item Description: Semiconductor Devic | 5961 | 000119482 | 0 | N | A | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | A | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 1n5597 | 1 | 1 | C | A |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | METAL |
| ABHP | OVERALL LENGTH | 0.347 INCHES MAXIMUM |
| ADAV | OVERALL DIAMETER | 1.950 INCHES MAXIMUM |
| AXGY | MOUNTING METHOD | THREADED STUD AND THREADED HOLE |
| CQJX | NOMINAL THREAD SIZE | 0.250 INCHES |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 10000.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION |
| TEST | TEST DATA DOCUMENT | 037Z3-03021 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWIN |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED HOLE AND 1 THREADED STUD |
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